Tool list: Difference between revisions

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Deposition: clean up PVD table to be compatible with sticky headers
Dry Etching & Plasma Cleaning: add materials to allow/disallowlists for RIE80
 
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|Up to 200 mm wafers
|Up to 200 mm wafers
|Si, SiO2, Si3N4
|Si, SiO2, Si3N4
As masks: Cr, graphene
Material removal: passivation (fluorine), resist (for descum), surface cleaning and activation
|No exposed metals (except Cr as a mask)
|No exposed metals (except Cr as a mask)
No deep etching polymers (>1 µm), may be used as a mask only
No deep etching polymers (>1 µm), may be used as a mask only
No deep or high-aspect-ratio processes (consult staff)
|Ar, O2, CF4, CHF3, SF6
|Ar, O2, CF4, CHF3, SF6
|20C
|20C
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* [[:File:Laser Endpoint SOP apr 2026.pdf|Laser Endpoint SOP]]
* [[:File:Laser Endpoint SOP apr 2026.pdf|Laser Endpoint SOP]]
* [https://drive.google.com/file/d/15cHZNcl4yK-OBauSIQ__ZOWv5xrtNU40/view?usp=sharing Training video]
* [https://drive.google.com/file/d/15cHZNcl4yK-OBauSIQ__ZOWv5xrtNU40/view?usp=sharing Training video]
* [https://docs.google.com/spreadsheets/d/e/2PACX-1vQq4XcefR151mYBgklqcWF9FOO8aEkGMUIhjG4EBruVm8xm6_LGaJOBhc3icg2DIVvD4bUZ4wXFI1G_/pubhtml?gid=873136343&single=true Standard Recipes]
* [Https://docs.google.com/spreadsheets/d/1cleuEcpL6Nnjj40jUlnfaEt4aXEZ23ReL1UCT6eQsUY/edit?gid=864539770#gid=864539770 Standard Recipe Calibration]
* [Https://docs.google.com/spreadsheets/d/1cleuEcpL6Nnjj40jUlnfaEt4aXEZ23ReL1UCT6eQsUY/edit?gid=864539770#gid=864539770 Standard Recipe Calibration]
|- <div id="XeF2 etcher"></div>
|- <div id="XeF2 etcher"></div>

Latest revision as of 13:19, 21 April 2026

Anneal & Furnace

Deposition

Dry Etching & Plasma Cleaning

See also: Dry etching recipes.

Lithography

Metrology

Packaging & Mechanical Tooling

PCB Processing

Wet Process