Dicing Saw
About

Process: This is a high-precision automatic dicing saw used for cutting wafers and substrates into individual dies or pieces. It employs a high-speed diamond blade with programmable X/Y/Z control for accurate, repeatable cuts with minimal chipping or kerf damage.
Hardware: 1.8 kW high-torque spindle for fast blade rotation. X/Y axes with 260 mm travel range. Z-axis max stroke 32.2 mm with 0.00005 mm resolution. High-accuracy linear motors and vision alignment system. Programmable cutting speed (0.1–600 mm/s) and index step (0.0001 mm). Repeatability 0.001 mm.
Key Features:
- Substrate size: Up to 8" wafers or 250×250 mm substrates
- Spindle power: 1.8 kW
- X/Y travel: 260 mm each axis
- Z-axis: Max stroke 32.2 mm, resolution 0.00005 mm
- Repeatability: 0.001 mm
- Cutting speed: 0.1 to 600 mm/s
- Index step: 0.0001 mm
Applications:
- Wafer dicing into individual dies (Si, GaAs, SiC, glass, etc.)
- Singulation of MEMS, photonic, or sensor devices
- Cutting of ceramic or composite substrates
- Precision sectioning for failure analysis or cross-section prep
- High-volume or prototype die separation
Usage: Mount wafer/substrate on dicing tape/frame, align using vision system, load program (cut depth, speed, step size), set blade height, run automatic or step-by-step cuts, unload after completion. Clean blade/chuck after use. Follow SOP for blade change and safety.
Detailed Specifications
- Model: DISCO Corp. DAD3350
- Location: Common Chase
- Substrate size: Up to 8" wafers or 250×250 mm
- Spindle: 1.8 kW
- X/Y-axis cutting range: 260 mm
- Cutting speed: 0.1 to 600 mm/s
- Index step: 0.0001 mm
- Z-axis max stroke: 32.2 mm
- Moving resolution: 0.00005 mm
- Repeatability accuracy: 0.001 mm
- Features: High-precision linear motors, vision alignment, programmable parameters, automatic operation
- Other: Industry-standard dicing saw for clean, accurate singulation in research and prototyping
Documentation
- SOP – Standard Operating Procedure
- Operation Manual
- Training videos:
* Part 1 * Part 2 * Part 3
- Training required – contact lab staff (Chandan Ramakrishnaiah or Shivakumar Bhaskaran)
Recipes & Data
- Standard Cutting: Common parameters include:
* Si wafers: Blade speed 30,000–60,000 rpm, feed rate 5–50 mm/s, depth 50–100 µm past substrate * Glass/ceramics: Lower feed rate (2–20 mm/s) to minimize chipping * Step size: Match die size (e.g., 1–10 mm streets)
- Process Control: Perform test cuts on sample pieces. Check kerf width, chipping, and die quality via microscope/SEM. Adjust blade height/depth for full cut without damaging tape.
- Notes: Use appropriate blade (hubbed or hubless) for material. Coolant (DI water) required. Secure tape/frame properly to avoid vibration. Blade dressing may be needed for new blades.
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