Oxford PECVD: Difference between revisions
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Updated by: Chandan Ramakrishnaiah | |||
Role: Lab Operation Engineer (Staff) | |||
Phone: +1 (213) 551-6726 | |||
Email: chandanr@usc.edu | |||
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== About == | == About == | ||
[[File:PECVD.jpg|thumb|300px|Oxford PlasmaPro System 100 PECVD tool in Deposition Bay 1]] | [[File:PECVD.jpg|thumb|300px|Oxford PlasmaPro System 100 PECVD tool in Deposition Bay 1]] | ||
This is an Oxford Instruments PlasmaPro System 100 plasma enhanced chemical vapor deposition (PECVD) tool optimized for depositing high-quality SiO₂, Si₃N₄, or SiOₓNᵧ dielectric films with excellent uniformity and control over properties like refractive index, stress, and etch rate. | |||
'''Hardware:''' Capacitively-coupled parallel-plate RF plasma system (13.56 MHz primary RF + low-frequency option). Gas is delivered via a showerhead over a heated electrode. Load lock for wafer transfer. No wafer clamping; fixed electrode height. Electrode diameter: '''240 mm.''' Substrate heater up to 400°C. | '''Hardware:''' Capacitively-coupled parallel-plate RF plasma system (13.56 MHz primary RF + low-frequency option). Gas is delivered via a showerhead over a heated electrode. Load lock for wafer transfer. No wafer clamping; fixed electrode height. Electrode diameter: '''240 mm.''' Substrate heater up to 400°C. | ||
| Line 17: | Line 21: | ||
'''Film Properties:''' | '''Film Properties:''' | ||
* SiO₂: Deposited using 2% SiH₄/N₂ + N₂O at | * SiO₂: Deposited using 2% SiH₄/N₂ + N₂O at 350°C; typical deposition rates ~492 Å/min depending on recipe. | ||
* Si₃N₄: Deposited using 2% SiH₄/N₂ + NH₃; denser films at higher temperatures; stress tunable via gas ratios/RF power. | * Si₃N₄: Deposited using 2% SiH₄/N₂ + NH₃; denser films at higher temperatures; stress tunable via gas ratios/RF power. | ||
* SiOₓNᵧ: Tunable oxynitrides by adjusting N₂O/NH₃ ratios. | * SiOₓNᵧ: Tunable oxynitrides by adjusting N₂O/NH₃ ratios. | ||
Films suitable for passivation, masks, insulators, AR coatings, etc. | Films suitable for passivation, masks, insulators, AR coatings, etc. | ||
'''Applications:''' Dielectric passivation, etch masks, electrical isolation, optical coatings, capacitor dielectrics | '''Applications:''' Dielectric passivation, etch masks, electrical isolation, optical coatings, capacitor dielectrics. | ||
'''Usage:''' Select/load recipes; input deposition time based on calibrated rates. Check current rates and uniformity via process control data or test runs. | '''Usage:''' Select/load recipes; input deposition time based on calibrated rates. Check current rates and uniformity via process control data or test runs. | ||
== Detailed Specifications == | == Detailed Specifications == | ||
* Model: PlasmaPro System 100 PECVD | * Model: PlasmaPro System 100/1 PECVD | ||
* Manufacturer: OXFORD INSTRUMENSTS | |||
* Tool Serial Number: 94-220205 (PlasmaPro System 100/1 PECVD) | |||
* Year Build: 2015 | |||
* Location: Deposition bay 1 | * Location: Deposition bay 1 | ||
* Substrate size: Up to '''6" wafers''' (pieces/smaller possible) | * Substrate size: Up to '''6" wafers''' (pieces/smaller possible) Default: '''4" wafers''' | ||
* Electrode: '''240 mm diameter''', heated up to 400°C | * Electrode: '''240 mm diameter''', heated up to 400°C | ||
* Plasma: RF 300 W (13.56 MHz), LF 500 W | * Plasma: RF Power (max) 300 W (13.56 MHz), LF Power (max) 500 W | ||
* Features: Load lock, no clamping (fixed height | * Features: Load lock, no clamping (fixed height) | ||
* Base pressure: Low mTorr range (high vacuum capability) | * Base pressure: Low mTorr range (high vacuum capability) | ||
* APC(Pressure Controller): (max) 2000 mTorr | |||
* Gases: 2% SiH₄/N₂, NH₃, N₂O, N₂, He, CF₄ | * Gases: 2% SiH₄/N₂, NH₃, N₂O, N₂, He, CF₄ | ||
* Other: Excellent film uniformity, stress/refractive index control, in-situ cleaning possible | * Other: Excellent film uniformity, stress/refractive index control, in-situ cleaning possible | ||
=== Vacuum Pumps === | |||
'''Roughing Pump — Adixen ADS 602 P''' (dry pump) | |||
* Serial No.: AP4130029 | |||
* Three-phase ratings: | |||
** 200 V △: 19 A (50/60 Hz) | |||
** 230/240 V △: 17 A (50/60 Hz), motor 5.7/6.2 A, short-circuit interrupting capacity 10 kA | |||
** 400/415 V Y: 11 A (50/60 Hz), motor 5.5/5.6 A, short-circuit interrupting capacity 10 kA | |||
** 460/480 V Y: 11 A (50/60 Hz), motor 3.2/3.4 A, short-circuit interrupting capacity 10 kA | |||
* Electrical schematic diagram reference: S9113-3 | |||
* Serviced by Pfeiffer Vacuum Qualified Service Center (punch-card sticker present on the tool) | |||
'''Secondary/Load Lock Pump — Pfeiffer Adixen ACP 15''' (dry scroll pump) | |||
* Serial No.: AC 681898 | |||
* Oil type: Fomblin | |||
* Voltage: 115 VAC | |||
* Remanufactured by PTB Sales -> [https://www.ptbsales.com www.ptbsales.com] | |||
* Service Date: 2/19/2025 | |||
=== Restrictions and Materials Allowed === | |||
{| class="wikitable" style="width:100%; margin-top:12px; border:3px solid #990000; background:#ffffff;" | |||
|- | |||
! style="width:50%; background:#990000; color:#FFCC00; padding:10px; font-size:14px; border:2px solid #990000;" | Restrictions | |||
! style="width:50%; background:#990000; color:#FFCC00; padding:10px; font-size:14px; border:2px solid #990000;" | Materials Allowed | |||
|- | |||
| style="vertical-align:top; padding:12px; border:2px solid #990000; background:#fff5f5;" | | |||
* Dielectric deposition only not for metal deposition. | |||
* No exposed gold, copper, or other soft/noble metals on samples (chamber cross-contamination). | |||
* New or unlisted substrate materials require staff approval before loading. | |||
* Resist/polymer substrates must tolerate process heat (heated electrode, up to 400°C) | |||
* Substrate size capped at 4" wafer; only qualified recipes and gas set may be run. | |||
* Avoid uncalibrated or high-stress film recipes (Consult staff). | |||
| style="vertical-align:top; padding:12px; border:2px solid #990000; background:#fffdf0;" | | |||
* SiO₂ | |||
* Si₃N₄ | |||
* SiOₓNᵧ | |||
* Si, quartz, glass, sapphire substrates | |||
* Approved metal underlayers (Al, Ti, Cr, Mo, W, Ta, Ni) | |||
* Process gases: 2% SiH₄/N₂, NH₃, N₂O, N₂, He, CF₄ | |||
|} | |||
== Safety & Emergency == | |||
'''Required PPE:''' Safety glasses, cleanroom gloves, bunny suit. | |||
'''Hazardous gases used:''' SiH₄ (silane) is '''pyrophoric''' it can ignite spontaneously on contact with air. NH₃ is toxic and corrosive. N₂O is an oxidizer. Do '''not''' open the chamber or break a gas line if a gas alarm is active on the tool control software, and confirm lines are purged with N₂ before any vent or service. | |||
'''If the tool alarms or gas cabinet shows red:''' | |||
# Press '''EMO''' (Emergency Machine Off) red button on the front panel. | |||
# Evacuate Deposition Bay 1 and notify staff immediately. | |||
# Call Nanofab staff: '''Joey Vo''' , +1 (213) 740-8914. | |||
# After hours / life-threatening: USC DPS '''(213) 740-4321''', or 911. | |||
'''Gas leak or chemical exposure:''' Activate bay alarm, exit cleanroom, call DPS. | |||
'''Chamber vent failure:''' Do NOT force open. Leave tool and contact staff. | |||
== Documentation == | == Documentation == | ||
* [https://wiki.nanofab.usc.edu/images/e/ef/PECVD_SOP_v1.pdf SOP] | |||
* [https://wiki.nanofab.usc.edu/images/e/ef/PECVD_SOP_v1.pdf | * Training required – contact lab staff (Joey Vo) [https://usc.qualtrics.com/jfe/form/SV_2ccy8prA0oRcZng Request form] | ||
* Training required – contact lab staff | |||
== Recipes & Data == | == Recipes & Data == | ||
* Standard Recipes: | * Standard Recipes: [https://docs.google.com/spreadsheets/d/e/2PACX-1vSzBDnY7sqB4mk5QJ6ak0imB3fvEhgy4gQTc2C9a4PAiDussR0d04fuVID3k0rOjo61o-bihdd2Bo0s/pubhtml?gid=1580577537&single=true Standard Recipe] | ||
* Process Control and Calibration Data: [https://docs.google.com/spreadsheets/d/e/2PACX-1vSzBDnY7sqB4mk5QJ6ak0imB3fvEhgy4gQTc2C9a4PAiDussR0d04fuVID3k0rOjo61o-bihdd2Bo0s/pubhtml?gid=1215456591&single=true Standard Recipe Calibration] | |||
* Process Control: Monitor deposition rates, uniformity (e.g. via Filmetrics F20 or ellipsometer), and particles after runs. | * Process Control: Monitor deposition rates, uniformity (e.g. via Filmetrics F20 or ellipsometer), and particles after runs. | ||
* Example uniformity/particle data: Perform DepCals and particle scans as per lab protocols. | * Example uniformity/particle data: Perform DepCals and particle scans as per lab protocols. | ||
==== Recipe Control Charts ==== | |||
* SiO2 Deposition Control Chart | |||
<div style="margin:10px 0 20px 0;"> | |||
<html><iframe width="700" height="600" seamless frameborder="0" scrolling="no" | |||
src="https://docs.google.com/spreadsheets/d/e/2PACX-1vSzBDnY7sqB4mk5QJ6ak0imB3fvEhgy4gQTc2C9a4PAiDussR0d04fuVID3k0rOjo61o-bihdd2Bo0s/pubchart?oid=2041127039&format=interactive"> | |||
</iframe></html> | |||
</div> | |||
* SiN Deposition Control Chart | |||
<div style="margin:10px 0 20px 0;"> | |||
<html><iframe width="700" height="600" seamless frameborder="0" scrolling="no" | |||
src="https://docs.google.com/spreadsheets/d/e/2PACX-1vSzBDnY7sqB4mk5QJ6ak0imB3fvEhgy4gQTc2C9a4PAiDussR0d04fuVID3k0rOjo61o-bihdd2Bo0s/pubchart?oid=2007166442&format=interactive"> | |||
</iframe></html> | |||
</div> | |||
== Troubleshooting == | |||
; Plasma won't ignite | |||
: Check gas flows are stable, chamber base pressure is in range, and the RF matching network is tuned. Confirm the load lock is fully pumped down before striking plasma. | |||
; Deposition rate has drifted from calibration | |||
: Chamber may need conditioning. Run a CF₄ plasma clean cycle, then re-verify with a DepCal coupon before resuming process runs. | |||
; Film stress or refractive index out of spec | |||
: Check the gas ratio (N₂O:SiH₄ or NH₃:SiH₄), RF/LF power split, and electrode temperature against the qualified recipe. | |||
; Poor uniformity or particles | |||
: Inspect the showerhead for clogging/residue, run a chamber clean, and verify electrode spacing hasn't drifted.(Consult Staff) | |||
; Heater not reaching setpoint | |||
: Allow a longer soak time; notify staff if the setpoint still isn't reached after 30 min. | |||
; Load lock won't pump down | |||
: Check the door seal/O-ring for wafer debris or damage; notify staff if the vacuum gauge doesn't respond. | |||
== Acknowledgment == | |||
If results from this tool appear in a publication, please acknowledge the facility: | |||
<blockquote> | |||
"This work was performed in part at the USC Nanofab at the University of Southern California, Michelson Center for Convergent Bioscience." | |||
</blockquote> | |||
Please also email the citation to [mailto:chandanr@usc.edu chandanr@usc.edu] so we can track facility output. | |||
Latest revision as of 12:36, 26 August 2026
About

This is an Oxford Instruments PlasmaPro System 100 plasma enhanced chemical vapor deposition (PECVD) tool optimized for depositing high-quality SiO₂, Si₃N₄, or SiOₓNᵧ dielectric films with excellent uniformity and control over properties like refractive index, stress, and etch rate.
Hardware: Capacitively-coupled parallel-plate RF plasma system (13.56 MHz primary RF + low-frequency option). Gas is delivered via a showerhead over a heated electrode. Load lock for wafer transfer. No wafer clamping; fixed electrode height. Electrode diameter: 240 mm. Substrate heater up to 400°C.
Gases:
- 2% SiH₄ in N₂ (silicon precursor, diluted for safety)
- NH₃ (ammonia – nitrogen precursor for nitrides)
- N₂O (nitrous oxide – oxygen precursor for oxides)
- N₂ (purge/carrier gas)
- He (carrier/diluent)
- CF₄ (chamber cleaning/etching)
Film Properties:
- SiO₂: Deposited using 2% SiH₄/N₂ + N₂O at 350°C; typical deposition rates ~492 Å/min depending on recipe.
- Si₃N₄: Deposited using 2% SiH₄/N₂ + NH₃; denser films at higher temperatures; stress tunable via gas ratios/RF power.
- SiOₓNᵧ: Tunable oxynitrides by adjusting N₂O/NH₃ ratios.
Films suitable for passivation, masks, insulators, AR coatings, etc.
Applications: Dielectric passivation, etch masks, electrical isolation, optical coatings, capacitor dielectrics.
Usage: Select/load recipes; input deposition time based on calibrated rates. Check current rates and uniformity via process control data or test runs.
Detailed Specifications
- Model: PlasmaPro System 100/1 PECVD
- Manufacturer: OXFORD INSTRUMENSTS
- Tool Serial Number: 94-220205 (PlasmaPro System 100/1 PECVD)
- Year Build: 2015
- Location: Deposition bay 1
- Substrate size: Up to 6" wafers (pieces/smaller possible) Default: 4" wafers
- Electrode: 240 mm diameter, heated up to 400°C
- Plasma: RF Power (max) 300 W (13.56 MHz), LF Power (max) 500 W
- Features: Load lock, no clamping (fixed height)
- Base pressure: Low mTorr range (high vacuum capability)
- APC(Pressure Controller): (max) 2000 mTorr
- Gases: 2% SiH₄/N₂, NH₃, N₂O, N₂, He, CF₄
- Other: Excellent film uniformity, stress/refractive index control, in-situ cleaning possible
Vacuum Pumps
Roughing Pump — Adixen ADS 602 P (dry pump)
- Serial No.: AP4130029
- Three-phase ratings:
- 200 V △: 19 A (50/60 Hz)
- 230/240 V △: 17 A (50/60 Hz), motor 5.7/6.2 A, short-circuit interrupting capacity 10 kA
- 400/415 V Y: 11 A (50/60 Hz), motor 5.5/5.6 A, short-circuit interrupting capacity 10 kA
- 460/480 V Y: 11 A (50/60 Hz), motor 3.2/3.4 A, short-circuit interrupting capacity 10 kA
- Electrical schematic diagram reference: S9113-3
- Serviced by Pfeiffer Vacuum Qualified Service Center (punch-card sticker present on the tool)
Secondary/Load Lock Pump — Pfeiffer Adixen ACP 15 (dry scroll pump)
- Serial No.: AC 681898
- Oil type: Fomblin
- Voltage: 115 VAC
- Remanufactured by PTB Sales -> www.ptbsales.com
- Service Date: 2/19/2025
Restrictions and Materials Allowed
| Restrictions | Materials Allowed |
|---|---|
|
|
Safety & Emergency
Required PPE: Safety glasses, cleanroom gloves, bunny suit.
Hazardous gases used: SiH₄ (silane) is pyrophoric it can ignite spontaneously on contact with air. NH₃ is toxic and corrosive. N₂O is an oxidizer. Do not open the chamber or break a gas line if a gas alarm is active on the tool control software, and confirm lines are purged with N₂ before any vent or service.
If the tool alarms or gas cabinet shows red:
- Press EMO (Emergency Machine Off) red button on the front panel.
- Evacuate Deposition Bay 1 and notify staff immediately.
- Call Nanofab staff: Joey Vo , +1 (213) 740-8914.
- After hours / life-threatening: USC DPS (213) 740-4321, or 911.
Gas leak or chemical exposure: Activate bay alarm, exit cleanroom, call DPS.
Chamber vent failure: Do NOT force open. Leave tool and contact staff.
Documentation
- SOP
- Training required – contact lab staff (Joey Vo) Request form
Recipes & Data
- Standard Recipes: Standard Recipe
- Process Control and Calibration Data: Standard Recipe Calibration
- Process Control: Monitor deposition rates, uniformity (e.g. via Filmetrics F20 or ellipsometer), and particles after runs.
- Example uniformity/particle data: Perform DepCals and particle scans as per lab protocols.
Recipe Control Charts
- SiO2 Deposition Control Chart
- SiN Deposition Control Chart
Troubleshooting
- Plasma won't ignite
- Check gas flows are stable, chamber base pressure is in range, and the RF matching network is tuned. Confirm the load lock is fully pumped down before striking plasma.
- Deposition rate has drifted from calibration
- Chamber may need conditioning. Run a CF₄ plasma clean cycle, then re-verify with a DepCal coupon before resuming process runs.
- Film stress or refractive index out of spec
- Check the gas ratio (N₂O:SiH₄ or NH₃:SiH₄), RF/LF power split, and electrode temperature against the qualified recipe.
- Poor uniformity or particles
- Inspect the showerhead for clogging/residue, run a chamber clean, and verify electrode spacing hasn't drifted.(Consult Staff)
- Heater not reaching setpoint
- Allow a longer soak time; notify staff if the setpoint still isn't reached after 30 min.
- Load lock won't pump down
- Check the door seal/O-ring for wafer debris or damage; notify staff if the vacuum gauge doesn't respond.
Acknowledgment
If results from this tool appear in a publication, please acknowledge the facility:
"This work was performed in part at the USC Nanofab at the University of Southern California, Michelson Center for Convergent Bioscience."
Please also email the citation to chandanr@usc.edu so we can track facility output.