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17 February 2026
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N 12:44 | Keithley S530 Parametric Test System 2 changes history +3,896 [Chandanr (2×)] | |||
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12:44 (cur | prev) +879 Chandanr talk contribs | ||||
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11:06 (cur | prev) +3,017 Chandanr talk contribs (Created page with "== About == thumb|300px|Keithley S530 Parametric Test System (typical rack with SMUs, switching, and optional testhead/probe interface) '''Process:''' This is a semiconductor parametric test system for automated wafer/device electrical characterization, primarily DC I-V and C-V measurements. It integrates with probers (e.g., Electroglas 4080X) for PCM/TEG/production monitoring. '''Hardware:''' Keithley S530 (built around...") | |||
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N 12:41 | Electroglas 4080X 6 changes history +3,870 [Chandanr (6×)] | |||
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12:41 (cur | prev) +439 Chandanr talk contribs | ||||
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12:35 (cur | prev) +335 Chandanr talk contribs | ||||
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11:05 (cur | prev) +18 Chandanr talk contribs Tag: Visual edit | ||||
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11:01 (cur | prev) +279 Chandanr talk contribs | ||||
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11:00 (cur | prev) −904 Chandanr talk contribs | ||||
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10:58 (cur | prev) +3,703 Chandanr talk contribs (Created page with "TOC == About == thumb|300px|Electroglas 4080X Automated Wafer Prober '''Process:''' This is an automated wafer prober used for wafer-level electrical testing preparation. It accurately places the wafer under a probe card, uses vision for alignment, and steps across die sites to enable a connected tester to perform electrical measurements and record/sort results. '''Hardware:''' Electroglas 4080X prober (modular: handler + probe...") | |||
