Tool list: Difference between revisions
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→Anneal & Furnace: add tool info |
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|Narco vacuum oven | |||
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* Model: Narco 5831 | |||
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* Dyna Lite 150 light source | * Dyna Lite 150 light source | ||
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Revision as of 16:14, 8 May 2025
Anneal & Furnace
| Tool | Location | Substrate size | Gases | Description |
|---|---|---|---|---|
| RTA (Rapid Thermal Annealer) | Deposition bay 1 | Small pieces, 2″, 3″, 4″, 5″, 6″ wafer capability | 5 gases (which?) |
|
| Cascade Tek Furnace | ||||
| Blue M furnace 1 | ||||
| Blue M furnace 2 | ||||
| Narco vacuum oven |
|
Deposition
| Tool | Location | Substrate size | Deposition films | Gases | Features | Links |
|---|---|---|---|---|---|---|
| Oxford PECVD | Deposition bay 1 | up to 6" wafer | SiO2, Si3N4, SiNO | 2% SiH4/N2, NH3, N2O, N2, He, CF4 |
|
SOP |
| Veeco ALD | Deposition bay 1 | up to 4" diameter or small pieces | MgO, Al2O3, Pt, Ru, HfO2, ZrO2, TiO2 | N2 as a carrier gas
O2 or O3 as film precursor |
|
SOP |
| Tool | Location | Substrate size
(up to diameter) |
# of pockets | E-beam voltage | Deposition materials | Gases | Features | Links |
|---|---|---|---|---|---|---|---|---|
| Angstrom Evaporator | Deposition bay 1 | 6" | 4 | 10kV | Ti, Al, Al2O3 | Ar, 5% O2 in Ar |
|
SOP |
| CHA Evaporator | Deposition bay 2 | 6" | 6 @ 15cc | 10kV | Ti, Au, Pt, Pd, Cr, Ni and Ag |
|
SOP | |
| KJL Evaporator | Deposition bay 1 | 6" | 4 | 5kV | Ti, Au, Pt, Pd, Cr, Ni and Ag |
|
||
| Temescal Metal e-beam evaporator | Not in service. | |||||||
| Substrate size | # of sources | Sputter power | ||||||
| KJL Sputter | Deposition bay 1 | 6" |
|
|
Au, Pt, Ti, Al, W, Mo, Cu, SiO2, Al2O3, ITO | Ar, O2 |
|
SOP |
Lithography
| Tool | Location | Substrate size | Exposure
resolution |
Features | Links |
|---|---|---|---|---|---|
| Raith EBL | Ebeam Bay | 4" wafer, or small pieces up to 2" | <8nm |
|
SOP |
| Heidelberg DWL | Metrology Bay |
|
300nm |
|
SOP |
| Tool | Location | Substrate
size |
Mask
size |
Exposure
resolution |
Features | Links |
|---|---|---|---|---|---|---|
| Aligner A (MJB3) | Advanced Photo bay | Pieces up to 3” | 3” and 4” | 0.8um |
|
SOP |
| Aligner B (MJB3) | Photo bay | Pieces up to 3” | 3” and 4” | 0.8um |
|
SOP |
| Aligner C (MJB4) | Photo bay | Pieces up to 2" | 3", 4", and 5" | 0.8um |
|
SOP |
| Aligner D (MA BA6 Gen4) | Advanced Photo Bay | 0.8um |
|
SOP |
Dry Etching
| Tool | Location | Substrate
size |
Allowed
materials |
Disallowed
materials |
Gases | Table temperature | Features | Links |
|---|---|---|---|---|---|---|---|---|
| Oxford DRIE | Etch bay 1 | 4" wafer clamp, smaller pieces may go onto carrier wafers
2″, 3″, 4″, 6″, 8″ wafers possible |
Si, SiO2, SiN, Parylene, polyimide, LiNbO3, BCB | No exposed metals (except Cr) | Ar, O2, CF4, CHF3, SF6, C4F8 | 20C |
|
|
| Oxford DRIE-ALE | Etch bay 1 |
|
||||||
| Oxford III-V | Etch bay 1 | 4" wafer clamp, smaller pieces may go onto carrier wafers
2″, 3″, 4″, 6″, 8″ wafers possible |
InP, InAs, GaN, AlGaAs, InGaAsP, ITO, Si, SiC, MoS2, WSe, Graphene | No exposed metals (except Cr)
No deep etching polymers (>1 µm) |
Ar, O2, SF6, CH4, H2, Cl2, BCl3, SiCl4 | -120 to 200C |
|
|
| Oxford RIE | Etch bay 1 | Up to 200 mm wafers | Si, SiO2, Si3N4 | No exposed metals (except Cr)
No deep etching polymers (>1 µm) |
Ar, O2, CF4, CHF3, SF6 | 20C |
|
|
| XeF2 etcher | Deposition bay 1 | Up to 6" wafers | Si | None | Crystal XeF2 source | 20C |
|
| Tool | Location | Substrate size | Allowed materials | Gases | Features |
|---|---|---|---|---|---|
| O2 Plasma Asher | Advanced Photo Bay | 200 mm pieces or wafers | Photoresist, graphene, CNT | O2 |
|
| Tegal Plasma | Advanced Photo Bay | Tegal 915 Plasma Strip | |||
| YES O2 Plasma | Advanced Photo Bay | 200mm pieces or wafers | O2 |
|
Metrology
| Tool | Location | Features | Links |
|---|---|---|---|
| 4-point Probe | Metrology bay |
|
|
| Dektak profilometer | Metrology bay |
|
SOP |
| Ellipsometer | Photo bay |
|
SOP |
| Filmetrics F20 | Photo bay | Thin film thickness measurement |
| Tool | Location | Features | Links |
|---|---|---|---|
| Desktop SEM | Metrology bay |
|
Operation manual |
| Nikon LV 150 optical microscope | Photo bay |
|
SOP |
| Max ERB optical microscope | Photo bay |
|
|
| Zeiss optical microscope | Advanced photo bay | ||
| Nikon SMZ-10A optical microscope | Advanced photo bay |
|
|
| Nikon optical microscope | Advanced photo bay |
|
Packaging & Mechanical Tooling
| Tool | Location | Substrate size | Features | Links |
|---|---|---|---|---|
| Ball & Wedge bonder | Etch bay 2 |
|
||
| Dicing Saw | Common chase | up to 8" or 250x250 mm |
|
|
| Mini Polisher | Common chase | up to 1" diameter |
|
|
| LatticeAx Cleaver | Photo bay |
|
Operation manual | |
| FlipScribe Cleaver | Photo bay |
|
||
| Vacuum Bag Sealer | Advanced photo bay |
|
| Tool | Location | Features | Links |
|---|---|---|---|
| LPKF PCB mill | Common chase |
|
Operation manual |
| LPKF electroplater | Common chase |
|
Operation manual |
Wet Process
| Tool | Description |
|---|---|
| Heated ultrasonic bath | |
| Hot plate |
| Tool | Description |
|---|---|
| Tool | Description |
|---|---|
| Tool | Description | Links |
|---|---|---|
| Spinner 1 | Laurell resist spinner (left side) | |
| Spinner 2 | Laurell resist spinner (right side) | |
| Bake plate 1 | Apogee bake plate | SOP |
| Bake plate 2 | Apogee bake plate | SOP |
| Bake plate 3 | Apogee bake plate | SOP |
| Bake plate 4 | Apogee bake plate | SOP |
| Tool | Description |
|---|---|
| Tool | Description |
|---|---|
| Tool | Description | Links |
|---|---|---|
| Headway spinner left |
|
SOP |
| Headway spinner right |
|
SOP |
| Apogee hot plate left | SOP | |
| Apogee hot plate right | SOP | |
| Torrey Pines hot plate/ stirrer |
|
|
| Ultrasonic heated bath |