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21 April 2026

  • 16:4516:45, 21 April 2026 Etcher Comparison (hist | edit) [7,893 bytes] Chandanr (talk | contribs) (Created page with "<!-- Updated by: Chandan Ramakrishnaiah Role: Lab Operation Engineer (Staff) Phone: +1 (213) 551-6726 Email: chandanr@usc.edu --> {| class="wikitable" style="width:100%; border:3px solid #990000; background:#ffffff; text-align:left;" |- ! style="background:#990000; color:#FFCC00; padding:10px; border:2px solid #990000; min-width:120px;" | Feature ! style="background:#990000; color:#FFCC00; padding:10px; border:2px solid #990000;" | Oxford RIE ! sty...")

17 February 2026

5 February 2026

  • 16:2016:20, 5 February 2026 Process Control Data (hist | edit) [4,012 bytes] Chandanr (talk | contribs) (Created page with "Process Control Data are standardized test processes, run by the USC Nanofab, allowing day-to-day or year-by-year comparisons of tool performance at the process level. This is similar to Statistical Process Control (SPC). These links appear on individual tool pages under the Process Control section. TOC Data are collected by trained users, Process Engineers, or interns and reviewed by Nanofab Staff. =Deposition, Dielectric (Process Control Data)= File:PECVD SPC Chart E...") Tag: Visual edit: Switched

4 February 2026

2 February 2026

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